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  • MOVPE

    Metal Organic Vapour Phase Epitaxy

    MOVPE growth of III-nitride materials is based on the vapor transport and chemical reactions of the precursors group III alkyls and V group hydrides. The metalorganic sources can be either liquids, such as trimethylgallium (TMGa), trimethylaluminum (TMAl) or solids, like trimethylindium (TMIn).
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  • AFM

    Atomic Force Microscopy

    AFM is a scanning probe microscopy technique, in which a nano-scale tip scans the sample surface. The system employs a laser beam detection system, where a laser beam is reflected from the back of the reflective cantilever and detected by a position-sensitive segmented photodiode

  • MRD/XRD

    X’Pert PRO Materials Research Diffractometer

    XRD is a non-destructive technique for investigating the atomic and molecular structure of condensed materials. It relies on the elastic scattering of x-rays from atoms arranged with a long range order. It provides information about the crystallographic structure, thickness, lattice parameters, strain, chemical composition and physical properties of bulk materials and thin films

  • Cleanroom

    Metal Deposition
    Lithography
    Evaporation
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  • TEM

    Transmission Electron Microscope

    In TEM, a high electron energy broad parallel beam (> 100 keV) is sent through a thin specimen. The measurements require special sample preparation by electro-polishing and ion-beam etching. The distribution of the transmitted electrons is imaged with an electromagnetic lens system onto a fluorescence screen or a CCD camera with the resolution of 0.1-0.2 nm.

  • Magnetotransport

    Magnetotransport technique is used to measure resistivity, Hall effect, magnetoresistance, etc. The system can be cooled down to 1.2 K and superconducting based magnet reaches 7 T.

  • Photoluminescence

    Photoluminescence spectroscopy is a contactless non-destructive probing techniques that provides information on the bang gap of semiconductor materials, on the impurity levels, on defects, recombination mechanisms as wells as on the crystallinity of the samples
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  • Raman Spectroscopy

    Raman spectroscopy based on the effect discovered by Sir C.V. Raman in 1928, has become one of the fundamental techniques to study the structure and properties of molecules from their vibrational transitions. It is a non-destructive, contactfree technique for material characterization, mostly used for biological and organic specimens. The chemical and physical properties of condensed materials are also studied by Raman spectroscopy.
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  • XPS

    X-Ray Photoelectron Spectrometer

    XPS is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material.
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  • FMR

    Ferromagnetic Resonance

    FMR is a spectroscopic technique to probe the magnetization of ferromagnetic materials. It is a standard tool for probing spin waves and spin dynamics.

JKU Institute of Semiconductor and Solid State Physics, Altenbergerstr. 69, 4040 Linz, Austria, Tel. +43 732 2468 9639, Fax +43 732 2468 8650